Fundamentals of the Physics of Solids / 08-Methods of Structure Determination

8.3 Other Methods of Structure Determination

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Fig. 8.18. Atomic resolution image of the (111) surface in silicon [F. Besenbacher and K. Mortensen, Europhys. News 21, 68 (1990)]

Further Reading

1.J. Als-Nielsen and D. McMorrow, Elements of Modern X-Ray Physics, John Wiley & Sons, Ltd., New York (2001).

2.R. W. James, The Optical Principles of the Di raction of X-Rays, Ox Bow Press, Woodbridge, Connecticut (1982).

3.D. McKie and C. McKie, Essentials of Crystallography, Blackwell Scientific Publications, Oxford (1986).

4.B. K. Vainshtein, Modern Crystallography, Vol. 1. Fundamentals of Crystals. Symmetry and Methods of Structural Crystallography, Second enlarged edition, Corrected 2nd printing, Springer-Verlag, Berlin (1996).

5.B. E. Warren, X-Ray Di raction, Addison-Wesley Publishing Co., Reading, Mass. (1969).

6.M. M. Woolfson, An Introduction to X-Ray Crystallography, Second Edition, Cambridge University Press, Cambridge (1997).