- •Features
- •1. Pin Configurations
- •1.1 Disclaimer
- •2. Overview
- •2.1 Block Diagram
- •2.2 Pin Descriptions
- •2.2.3 AVCC
- •2.2.4 AGND
- •2.2.5 Port A (PA7..PA0)
- •2.2.6 Port B (PB7..PB0)
- •2.2.7 RESET
- •3. Resources
- •4. About Code Examples
- •5. AVR CPU Core
- •5.1 Overview
- •5.3 Status Register
- •5.4 General Purpose Register File
- •5.5 Stack Pointer
- •5.6 Instruction Execution Timing
- •5.7 Reset and Interrupt Handling
- •5.7.1 Interrupt Response Time
- •6. AVR Memories
- •6.2 SRAM Data Memory
- •6.2.1 Data Memory Access Times
- •6.3 EEPROM Data Memory
- •6.3.1 EEPROM Read/Write Access
- •6.3.2 Atomic Byte Programming
- •6.3.3 Split Byte Programming
- •6.3.4 Erase
- •6.3.5 Write
- •6.3.6 Preventing EEPROM Corruption
- •6.4 I/O Memory
- •6.4.1 General Purpose I/O Registers
- •6.5 Register Description
- •7. System Clock and Clock Options
- •7.1 Clock Systems and their Distribution
- •7.2 Clock Sources
- •7.3 Default Clock Source
- •7.4 External Clock
- •7.6 Calibrated Internal RC Oscillator
- •7.7 128 kHz Internal Oscillator
- •7.9 Crystal Oscillator
- •7.10 Clock Output Buffer
- •7.11 System Clock Prescaler
- •7.11.1 Switching Time
- •7.12 Register Description
- •8. Power Management and Sleep Modes
- •8.1 Sleep Modes
- •8.2 Idle Mode
- •8.3 ADC Noise Reduction Mode
- •8.5 Standby Mode
- •8.6 Power Reduction Register
- •8.7 Minimizing Power Consumption
- •8.7.1 Analog to Digital Converter
- •8.7.2 Analog Comparator
- •8.7.4 Internal Voltage Reference
- •8.7.5 Watchdog Timer
- •8.7.6 Port Pins
- •8.8 Register Description
- •9. System Control and Reset
- •9.0.1 Resetting the AVR
- •9.0.2 Reset Sources
- •9.0.4 External Reset
- •9.0.6 Watchdog Reset
- •9.1 Internal Voltage Reference
- •9.2 Watchdog Timer
- •9.3 Timed Sequences for Changing the Configuration of the Watchdog Timer
- •9.3.1 Safety Level 1
- •9.3.2 Safety Level 2
- •9.4 Register Description
- •10. Interrupts
- •10.1 Interrupt Vectors in ATtiny261/461/861
- •11. External Interrupts
- •11.1 Register Description
- •12. I/O Ports
- •12.1 Overview
- •12.2 Ports as General Digital I/O
- •12.2.1 Configuring the Pin
- •12.2.2 Toggling the Pin
- •12.2.3 Switching Between Input and Output
- •12.2.4 Reading the Pin Value
- •12.2.5 Digital Input Enable and Sleep Modes
- •12.2.6 Unconnected Pins
- •12.3 Alternate Port Functions
- •12.3.1 Alternate Functions of Port B
- •12.3.2 Alternate Functions of Port A
- •12.4 Register Description
- •13. Timer/Counter0 Prescaler
- •13.0.1 Prescaler Reset
- •13.0.2 External Clock Source
- •13.1 Register Description
- •14. Timer/Counter0
- •14.1 Features
- •14.2 Overview
- •14.2.1 Registers
- •14.2.2 Definitions
- •14.3 Timer/Counter Clock Sources
- •14.4 Counter Unit
- •14.5 Modes of Operation
- •14.5.1 Normal 8-bit Mode
- •14.6 Input Capture Unit
- •14.6.1 Input Capture Trigger Source
- •14.6.2 Noise Canceler
- •14.6.3 Using the Input Capture Unit
- •14.7 Output Compare Unit
- •14.7.1 Compare Match Blocking by TCNT0 Write
- •14.7.2 Using the Output Compare Unit
- •14.8 Timer/Counter Timing Diagrams
- •14.9.1 Reusing the temporary high byte register
- •14.10 Register Description
- •15. Timer/Counter1 Prescaler
- •15.0.1 Prescaler Reset
- •15.0.2 Prescaler Initialization for Asynchronous Mode
- •15.1 Register Description
- •16. Timer/Counter1
- •16.1 Features
- •16.2 Overview
- •16.2.1 Speed
- •16.2.2 Accuracy
- •16.2.3 Registers
- •16.2.4 Synchronization
- •16.2.5 Definitions
- •16.3 Counter Unit
- •16.3.1 Counter Initialization for Asynchronous Mode
- •16.4 Output Compare Unit
- •16.4.1 Force Output Compare
- •16.4.2 Compare Match Blocking by TCNT1 Write
- •16.4.3 Using the Output Compare Unit
- •16.5 Dead Time Generator
- •16.6 Compare Match Output Unit
- •16.6.1 Compare Output Mode and Waveform Generation
- •16.7 Modes of Operation
- •16.7.1 Normal Mode
- •16.7.3 Phase and Frequency Correct PWM Mode
- •16.7.4 PWM6 Mode
- •16.8 Timer/Counter Timing Diagrams
- •16.9 Fault Protection Unit
- •16.9.1 Fault Protection Trigger Source
- •16.9.2 Noise Canceler
- •16.10 Accessing 10-Bit Registers
- •16.10.1 Reusing the temporary high byte register
- •16.11 Register Description
- •17.1 Features
- •17.2 Overview
- •17.3 Functional Descriptions
- •17.3.2 SPI Master Operation Example
- •17.3.3 SPI Slave Operation Example
- •17.3.5 Start Condition Detector
- •17.4 Alternative USI Usage
- •17.4.4 Edge Triggered External Interrupt
- •17.4.5 Software Interrupt
- •17.5 Register Descriptions
- •18.1 Register Description
- •18.2 Analog Comparator Multiplexed Input
- •19.1 Features
- •19.2 Overview
- •19.3 Operation
- •19.4 Starting a Conversion
- •19.5 Prescaling and Conversion Timing
- •19.6 Changing Channel or Reference Selection
- •19.6.1 ADC Input Channels
- •19.6.2 ADC Voltage Reference
- •19.7 ADC Noise Canceler
- •19.7.1 Analog Input Circuitry
- •19.7.2 Analog Noise Canceling Techniques
- •19.7.3 ADC Accuracy Definitions
- •19.8 ADC Conversion Result
- •19.8.1 Single Ended Conversion
- •19.8.2 Unipolar Differential Conversion
- •19.8.3 Bipolar Differential Conversion
- •19.9 Temperature Measurement
- •19.10 Register Descriptin
- •19.10.3.1 ADLAR = 0
- •19.10.3.2 ADLAR = 1
- •20. debugWIRE On-chip Debug System
- •20.1 Features
- •20.2 Overview
- •20.3 Physical Interface
- •20.4 Software Break Points
- •20.5 Limitations of debugWIRE
- •20.6 Register Description
- •21. Self-Programming the Flash
- •21.0.1 Performing Page Erase by SPM
- •21.0.2 Filling the Temporary Buffer (Page Loading)
- •21.0.3 Performing a Page Write
- •21.1.1 EEPROM Write Prevents Writing to SPMCSR
- •21.1.2 Reading the Fuse and Lock Bits from Software
- •21.1.3 Preventing Flash Corruption
- •21.1.4 Programming Time for Flash when Using SPM
- •21.2 Register Description
- •22. Memory Programming
- •22.1 Program And Data Memory Lock Bits
- •22.2 Fuse Bytes
- •22.2.1 Latching of Fuses
- •22.3 Signature Bytes
- •22.4 Calibration Byte
- •22.5 Page Size
- •22.6 Parallel Programming Parameters, Pin Mapping, and Commands
- •22.6.1 Signal Names
- •22.7 Parallel Programming
- •22.7.1 Enter Programming Mode
- •22.7.2 Considerations for Efficient Programming
- •22.7.3 Chip Erase
- •22.7.4 Programming the Flash
- •22.7.5 Programming the EEPROM
- •22.7.6 Reading the Flash
- •22.7.7 Reading the EEPROM
- •22.7.8 Programming the Fuse Low Bits
- •22.7.9 Programming the Fuse High Bits
- •22.7.10 Programming the Extended Fuse Bits
- •22.7.11 Programming the Lock Bits
- •22.7.12 Reading the Fuse and Lock Bits
- •22.7.13 Reading the Signature Bytes
- •22.7.14 Reading the Calibration Byte
- •22.8 Serial Downloading
- •22.8.1 Serial Programming Algorithm
- •22.8.2 Serial Programming Instruction set
- •23. Electrical Characteristics
- •23.1 Absolute Maximum Ratings*
- •23.2 DC Characteristics
- •23.3 Speed Grades
- •23.4 Clock Characteristics
- •23.4.1 Calibrated Internal RC Oscillator Accuracy
- •23.4.2 External Clock Drive Waveforms
- •23.4.3 External Clock Drive
- •23.5 System and Reset Characteristics
- •23.7 Parallel Programming Characteristics
- •23.8 Serial Programming Characteristics
- •24. Typical Characteristics
- •24.1 Active Supply Current
- •24.2 Idle Supply Current
- •24.3 Supply Current of I/O modules
- •Example
- •24.6 Pin Driver Strength
- •24.7 Pin Threshold and Hysteresis
- •24.8 BOD Threshold and Analog Comparator Offset
- •24.9 Internal Oscillator Speed
- •24.10 Current Consumption of Peripheral Units
- •24.11 Current Consumption in Reset and Reset Pulsewidth
- •25. Register Summary
- •26. Instruction Set Summary
- •27. Ordering Information
- •27.1 ATtiny261
- •27.2 ATtiny461
- •27.3 ATtiny861
- •28. Packaging Information
- •29. Errata
- •29.1 Errata ATtiny261
- •29.2 Errata ATtiny461
- •29.3 Errata ATtiny861
- •30. Datasheet Revision History
- •Table of Contents
ATtiny261/461/861
155). The voltage on the positive pin must always be larger than the voltage on the negative pin or otherwise the voltage difference is saturated to zero. The result is presented in one-sided form, from 0x000 (0d) to 0x3FF (+1023d). The GAIN is either 1x, 8x, 20x or 32x.
19.8.3Bipolar Differential Conversion
As default the ADC converter operates in the unipolar input mode, but the bipolar input mode can be selected by writting the BIN bit in the ADCSRB to one. In the bipolar input mode twosided voltage differences are allowed and thus the voltage on the negative input pin can also be larger than the voltage on the positive input pin. If differential channels and a bipolar input mode are used, the result is
ADC (VPOS – VNEG) 512 GAIN
= ----------------------------------------------------
VREF
where VPOS is the voltage on the positive input pin, VNEG the voltage on the negative input pin, and VREF the selected voltage reference. The result is presented in two’s complement form, from 0x200 (-512d) through 0x000 (+0d) to 0x1FF (+511d). The GAIN is either 1x, 8x, 20x or 32x.
However, if the signal is not bipolar by nature (9 bits + sign as the 10th bit), this scheme loses one bit of the converter dynamic range. Then, if the user wants to perform the conversion with the maximum dynamic range, the user can perform a quick polarity check of the result and use the unipolar differential conversion with selectable differential input pair. When the polarity check is performed, it is sufficient to read the MSB of the result (ADC9 in ADCH). If the bit is one, the result is negative, and if this bit is zero, the result is positive.
19.9Temperature Measurement
The temperature measurement is based on an on-chip temperature sensor that is coupled to a single ended ADC11 channel. Selecting the ADC11 channel by writing the MUX5..0 bits in ADMUX register to “111111” enables the temperature sensor. The internal 1.1V voltage reference must also be selected for the ADC voltage reference source in the temperature sensor measurement. When the temperature sensor is enabled, the ADC converter can be used in single conversion mode to measure the voltage over the temperature sensor.
The measured voltage has a linear relationship to the temperature as described in Table 19-2 on page 153. The voltage sensitivity is approximately 1 mV/°C and the accuracy of the temperature measurement is +/- 10°C after bandgap calibration.
Table 19-2. Temperature vs. Sensor Output Voltage (Typical Case)
Temperature / °C |
-40 °C |
+25 °C |
+85 °C |
|
|
|
|
Voltage / mV |
247 mV |
314 mv |
382 mV |
|
|
|
|
The values described in Table 19-2 on page 153 are typical values. However, due to the process variation the temperature sensor output voltage varies from one chip to another. To be capable of achieving more accurate results the temperature measurement can be calibrated in the application software. The software calibration requires that a calibration value is measured and stored in a register or EEPROM for each chip. The sofware calibration can be done utilizing the formula:
T = { [ (ADCH << 8) | ADCL ] - TOS } / k
153
2588B–AVR–11/06