- •Features
- •1. Pin Configurations
- •2. Overview
- •2.1 Block Diagram
- •2.2 Automotive Quality Grade
- •2.3 Pin Descriptions
- •2.3.3 Port B (PB5..PB0)
- •2.3.4 RESET
- •3. About Code Examples
- •4. AVR CPU Core
- •4.1 Introduction
- •4.2 Architectural Overview
- •4.4 Status Register
- •4.5 General Purpose Register File
- •4.6 Stack Pointer
- •4.7 Instruction Execution Timing
- •4.8 Reset and Interrupt Handling
- •4.8.1 Interrupt Response Time
- •5. AVR ATtiny25/45/85 Memories
- •5.2 SRAM Data Memory
- •5.2.1 Data Memory Access Times
- •5.3 EEPROM Data Memory
- •5.3.1 EEPROM Read/Write Access
- •5.3.6 Atomic Byte Programming
- •5.3.7 Split Byte Programming
- •5.3.8 Erase
- •5.3.9 Write
- •5.3.10 Preventing EEPROM Corruption
- •5.4 I/O Memory
- •6. System Clock and Clock Options
- •6.1 Clock Systems and their Distribution
- •6.2 Clock Sources
- •6.3 Default Clock Source
- •6.4 Crystal Oscillator
- •6.6 Calibrated Internal RC Oscillator
- •6.7 External Clock
- •6.8 128 kHz Internal Oscillator
- •6.9 Clock Output Buffer
- •6.10 System Clock Prescaler
- •6.10.2 Switching Time
- •7. Power Management and Sleep Modes
- •7.1 Idle Mode
- •7.2 ADC Noise Reduction Mode
- •7.4 Power Reduction Register
- •7.5 Minimizing Power Consumption
- •7.5.1 Analog to Digital Converter
- •7.5.2 Analog Comparator
- •7.5.4 Internal Voltage Reference
- •7.5.5 Watchdog Timer
- •7.5.6 Port Pins
- •8. System Control and Reset
- •8.0.1 Resetting the AVR
- •8.0.2 Reset Sources
- •8.0.3 Power-on Reset
- •8.0.4 External Reset
- •8.0.6 Watchdog Reset
- •8.1 Internal Voltage Reference
- •8.2 Watchdog Timer
- •8.3 Timed Sequences for Changing the Configuration of the Watchdog Timer
- •8.3.1 Safety Level 1
- •8.3.2 Safety Level 2
- •9. Interrupts
- •9.1 Interrupt Vectors in ATtiny25/45/85
- •10. I/O Ports
- •10.1 Introduction
- •10.2 Ports as General Digital I/O
- •10.2.1 Configuring the Pin
- •10.2.2 Toggling the Pin
- •10.2.3 Switching Between Input and Output
- •10.2.4 Reading the Pin Value
- •10.2.5 Digital Input Enable and Sleep Modes
- •10.2.6 Unconnected Pins
- •10.3 Alternate Port Functions
- •10.3.2 Alternate Functions of Port B
- •11. External Interrupts
- •12. 8-bit Timer/Counter0 with PWM
- •12.1 Overview
- •12.1.1 Registers
- •12.1.2 Definitions
- •12.2 Timer/Counter Clock Sources
- •12.3 Counter Unit
- •12.4 Output Compare Unit
- •12.4.1 Force Output Compare
- •12.4.2 Compare Match Blocking by TCNT0 Write
- •12.4.3 Using the Output Compare Unit
- •12.5 Compare Match Output Unit
- •12.5.1 Compare Output Mode and Waveform Generation
- •12.6 Modes of Operation
- •12.6.1 Normal Mode
- •12.6.2 Clear Timer on Compare Match (CTC) Mode
- •12.6.3 Fast PWM Mode
- •12.6.4 Phase Correct PWM Mode
- •12.7 Timer/Counter Timing Diagrams
- •13. Timer/Counter Prescaler
- •13.0.1 Prescaler Reset
- •13.0.2 External Clock Source
- •14. 8-bit Timer/Counter1
- •14.1 Timer/Counter1
- •14.1.1 Timer/Counter1 Control Register - TCCR1
- •14.1.2 General Timer/Counter1 Control Register - GTCCR
- •14.1.3 Timer/Counter1 - TCNT1
- •14.1.4 Timer/Counter1 Output Compare RegisterA - OCR1A
- •14.1.5 Timer/Counter1 Output Compare RegisterB - OCR1B
- •14.1.6 Timer/Counter1 Output Compare RegisterC - OCR1C
- •14.1.7 Timer/Counter Interrupt Mask Register - TIMSK
- •14.1.8 Timer/Counter Interrupt Flag Register - TIFR
- •14.1.9 PLL Control and Status Register - PLLCSR
- •14.1.10 Timer/Counter1 Initialization for Asynchronous Mode
- •14.1.11 Timer/Counter1 in PWM Mode
- •15. 8-bit Timer/Counter1 in ATtiny15 Mode
- •15.1 Timer/Counter1 Prescaler
- •15.2 Timer/Counter1
- •15.2.2 Timer/Counter1 Control Register - TCCR1
- •15.2.3 General Timer/Counter1 Control Register - GTCCR
- •15.2.4 Timer/Counter1 - TCNT1
- •15.2.5 Timer/Counter1 Output Compare RegisterA - OCR1A
- •15.2.6 Timer/Counter1 Output Compare Register C - OCR1C
- •15.2.7 Timer/Counter Interrupt Flag Register - TIFR
- •15.2.8 PLL Control and Status Register - PLLCSR
- •15.2.9 Timer/Counter1 in PWM Mode
- •16. Dead Time Generator
- •16.0.1 Timer/Counter1 Dead Time Prescaler register 1 - DTPS1
- •16.0.2 Timer/Counter1 Dead Time A - DT1A
- •16.0.3 Timer/Counter1 Dead Time B - DT1B
- •17.1 Overview
- •17.2 Functional Descriptions
- •17.2.2 SPI Master Operation Example
- •17.2.3 SPI Slave Operation Example
- •17.2.5 Start Condition Detector
- •17.3 Alternative USI Usage
- •17.3.4 Edge Triggered External Interrupt
- •17.3.5 Software Interrupt
- •17.4 USI Register Descriptions
- •18. Analog Comparator
- •18.1 Analog Comparator Multiplexed Input
- •19. Analog to Digital Converter
- •19.1 Features
- •19.2 Operation
- •19.3 Starting a Conversion
- •19.4 Prescaling and Conversion Timing
- •19.5 Changing Channel or Reference Selection
- •19.5.1 ADC Input Channels
- •19.5.2 ADC Voltage Reference
- •19.6 ADC Noise Canceler
- •19.6.1 Analog Input Circuitry
- •19.6.2 Analog Noise Canceling Techniques
- •19.6.3 ADC Accuracy Definitions
- •19.7 ADC Conversion Result
- •19.7.1 Single Ended Conversion
- •19.7.2 Unipolar Differential Conversion
- •19.7.3 Bipolar Differential Conversion
- •19.7.4 Temperature Measurement (Preliminary description)
- •19.7.7.1 ADLAR = 0
- •19.7.7.2 ADLAR = 1
- •20. debugWIRE On-chip Debug System
- •20.1 Features
- •20.2 Overview
- •20.3 Physical Interface
- •20.4 Software Break Points
- •20.5 Limitations of debugWIRE
- •20.6 debugWIRE Related Register in I/O Memory
- •21. Self-Programming the Flash
- •21.0.1 Performing Page Erase by SPM
- •21.0.2 Filling the Temporary Buffer (Page Loading)
- •21.0.3 Performing a Page Write
- •21.1.2 EEPROM Write Prevents Writing to SPMCSR
- •21.1.3 Reading the Fuse and Lock Bits from Software
- •21.1.4 Preventing Flash Corruption
- •21.1.5 Programming Time for Flash when Using SPM
- •22. Memory Programming
- •22.1 Program And Data Memory Lock Bits
- •22.2 Fuse Bytes
- •22.2.1 Latching of Fuses
- •22.3 Signature Bytes
- •22.3.1 ATtiny25 Signature Bytes
- •22.3.2 ATtiny45 Signature Bytes
- •22.3.3 ATtiny85 Signature Bytes
- •22.4 Calibration Byte
- •22.5 Page Size
- •22.6 Serial Downloading
- •22.6.1 Serial Programming Algorithm
- •22.6.2 Serial Programming Characteristics
- •22.7 High-voltage Serial Programming
- •22.8.2 Considerations for Efficient Programming
- •22.8.3 Chip Erase
- •22.8.4 Programming the Flash
- •22.8.5 Programming the EEPROM
- •22.8.6 Reading the Flash
- •22.8.7 Reading the EEPROM
- •22.8.8 Programming and Reading the Fuse and Lock Bits
- •22.8.9 Reading the Signature Bytes and Calibration Byte
- •23. Electrical Characteristics
- •23.1 Absolute Maximum Ratings*
- •23.2 External Clock Drive Waveforms
- •23.3 External Clock Drive
- •23.5 Calibrated RC Oscillator Accuracy
- •24. Typical Characteristics
- •24.1 Active Supply Current
- •24.2 Idle Supply Current
- •24.2.1 Using the Power Reduction Register
- •24.2.1.1 Example 1
- •24.5 Pin Driver Strength
- •24.6 Pin Thresholds and Hysteresis
- •24.7 BOD Thresholds and Analog Comparator Offset
- •24.8 Internal Oscillator Speed
- •24.9 Current Consumption of Peripheral Units
- •24.10 Current Consumption in Reset and Reset Pulse width
- •24.11 Analog to Digital Converter
- •25. Register Summary
- •26. Instruction Set Summary
- •27. Ordering Information
- •28. Packaging Information
- •29. Document Revision History
- •30. Errata
- •30.1 ATtiny25/45/85 Rev. A
ATtiny25/45/85 Auto
value of the Fuse High byte (FHB) will be loaded in the destination register as shown below. Refer to Table XXX on page XXX for detailed description and mapping of the Fuse High byte.
Bit |
7 |
6 |
5 |
4 |
3 |
2 |
1 |
0 |
Rd |
FHB7 |
FHB6 |
FHB5 |
FHB4 |
FHB3 |
FHB2 |
FHB1 |
FHB0 |
|
|
|
|
|
|
|
|
|
Fuse and Lock bits that are programmed, will be read as zero. Fuse and Lock bits that are unprogrammed, will be read as one.
21.1.4Preventing Flash Corruption
During periods of low VCC, the Flash program can be corrupted because the supply voltage is too low for the CPU and the Flash to operate properly. These issues are the same as for board level systems using the Flash, and the same design solutions should be applied.
A Flash program corruption can be caused by two situations when the voltage is too low. First, a regular write sequence to the Flash requires a minimum voltage to operate correctly. Secondly, the CPU itself can execute instructions incorrectly, if the supply voltage for executing instructions is too low.
Flash corruption can easily be avoided by following these design recommendations (one is sufficient):
1.Keep the AVR RESET active (low) during periods of insufficient power supply voltage. This can be done by enabling the internal Brown-out Detector (BOD) if the operating
voltage matches the detection level. If not, an external low VCC reset protection circuit can be used. If a reset occurs while a write operation is in progress, the write operation will be completed provided that the power supply voltage is sufficient.
2.Keep the AVR core in Power-down sleep mode during periods of low VCC. This will prevent the CPU from attempting to decode and execute instructions, effectively protecting the SPMCSR Register and thus the Flash from unintentional writes.
21.1.5Programming Time for Flash when Using SPM
The calibrated RC Oscillator is used to time Flash accesses. Table 21-1 shows the typical programming time for Flash accesses from the CPU.
Table 21-1. SPM Programming Time
Symbol |
Min Programming Time |
Max Programming Time |
|
|
|
|
|
Flash write (Page Erase, Page Write, and |
3.7 ms |
4.5 ms |
|
write Lock bits by SPM) |
|||
|
|
||
|
|
|
22. Memory Programming
This section describes the different methods for Programming the ATtiny25/45/85 memories.
22.1Program And Data Memory Lock Bits
The ATtiny25/45/85 provides two Lock bits which can be left unprogrammed (“1”) or can be programmed (“0”) to obtain the additional security listed in Table 22-2. The Lock bits can only be erased to “1” with the Chip Erase command.
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7598C–AVR–09/06