- •1. Pin Configurations
- •1.1 Disclaimer
- •2. Overview
- •2.1 Block Diagram
- •2.2 Pin Descriptions
- •2.2.3 Port B (PB3...PB0)
- •2.2.4 RESET
- •2.2.5 Port A (PA7...PA0)
- •3. Resources
- •4. About Code Examples
- •5. CPU Core
- •5.1 Overview
- •5.2 Architectural Overview
- •5.4 Status Register
- •5.5 General Purpose Register File
- •5.6 Stack Pointer
- •5.7 Instruction Execution Timing
- •5.8 Reset and Interrupt Handling
- •5.8.1 Interrupt Response Time
- •6. Memories
- •6.2 SRAM Data Memory
- •6.2.1 Data Memory Access Times
- •6.3 EEPROM Data Memory
- •6.3.1 EEPROM Read/Write Access
- •6.3.2 Atomic Byte Programming
- •6.3.3 Split Byte Programming
- •6.3.4 Erase
- •6.3.5 Write
- •6.3.6 Preventing EEPROM Corruption
- •6.4 I/O Memory
- •6.4.1 General Purpose I/O Registers
- •6.5 Register Description
- •7. System Clock and Clock Options
- •7.1 Clock Systems and their Distribution
- •7.2 Clock Sources
- •7.3 Default Clock Source
- •7.4 Crystal Oscillator
- •7.6 Calibrated Internal RC Oscillator
- •7.7 External Clock
- •7.8 128 kHz Internal Oscillator
- •7.9 System Clock Prescaler
- •7.9.1 Switching Time
- •7.10 Register Description
- •8. Power Management and Sleep Modes
- •8.1 Sleep Modes
- •8.2 Idle Mode
- •8.3 ADC Noise Reduction Mode
- •8.5 Standby Mode
- •8.6 Power Reduction Register
- •8.7 Minimizing Power Consumption
- •8.7.1 Analog to Digital Converter
- •8.7.2 Analog Comparator
- •8.7.4 Internal Voltage Reference
- •8.7.5 Watchdog Timer
- •8.7.6 Port Pins
- •8.8 Register Description
- •9. System Control and Reset
- •9.0.1 Resetting the AVR
- •9.0.2 Reset Sources
- •9.0.3 Power-on Reset
- •9.0.4 External Reset
- •9.0.6 Watchdog Reset
- •9.1 Internal Voltage Reference
- •9.2 Watchdog Timer
- •9.3 Timed Sequences for Changing the Configuration of the Watchdog Timer
- •9.3.1 Safety Level 1
- •9.3.2 Safety Level 2
- •9.4 Register Description
- •10. Interrupts
- •10.1 Interrupt Vectors
- •11. External Interrupts
- •11.1 Pin Change Interrupt Timing
- •11.2 Register Description
- •12. I/O Ports
- •12.1 Overview
- •12.2 Ports as General Digital I/O
- •12.2.1 Configuring the Pin
- •12.2.2 Toggling the Pin
- •12.2.3 Switching Between Input and Output
- •12.2.4 Reading the Pin Value
- •12.2.5 Digital Input Enable and Sleep Modes
- •12.2.6 Unconnected Pins
- •12.3 Alternate Port Functions
- •12.3.1 Alternate Functions of Port A
- •12.3.2 Alternate Functions of Port B
- •12.4 Register Description
- •13. 8-bit Timer/Counter0 with PWM
- •13.1 Features
- •13.2 Overview
- •13.2.1 Registers
- •13.2.2 Definitions
- •13.3 Timer/Counter Clock Sources
- •13.4 Counter Unit
- •13.5 Output Compare Unit
- •13.5.1 Force Output Compare
- •13.5.2 Compare Match Blocking by TCNT0 Write
- •13.5.3 Using the Output Compare Unit
- •13.6 Compare Match Output Unit
- •13.6.1 Compare Output Mode and Waveform Generation
- •13.7 Modes of Operation
- •13.7.1 Normal Mode
- •13.7.2 Clear Timer on Compare Match (CTC) Mode
- •13.7.3 Fast PWM Mode
- •13.7.4 Phase Correct PWM Mode
- •13.8 Timer/Counter Timing Diagrams
- •13.9 Register Description
- •14. 16-bit Timer/Counter1
- •14.1 Features
- •14.2 Overview
- •14.2.1 Registers
- •14.2.2 Definitions
- •14.2.3 Compatibility
- •14.3.1 Reusing the Temporary High Byte Register
- •14.4 Timer/Counter Clock Sources
- •14.5 Counter Unit
- •14.6 Input Capture Unit
- •14.6.1 Input Capture Trigger Source
- •14.6.2 Noise Canceler
- •14.6.3 Using the Input Capture Unit
- •14.7 Output Compare Units
- •14.7.1 Force Output Compare
- •14.7.2 Compare Match Blocking by TCNT1 Write
- •14.7.3 Using the Output Compare Unit
- •14.8 Compare Match Output Unit
- •14.8.1 Compare Output Mode and Waveform Generation
- •14.9 Modes of Operation
- •14.9.1 Normal Mode
- •14.9.2 Clear Timer on Compare Match (CTC) Mode
- •14.9.3 Fast PWM Mode
- •14.9.4 Phase Correct PWM Mode
- •14.9.5 Phase and Frequency Correct PWM Mode
- •14.10 Timer/Counter Timing Diagrams
- •14.11 Register Description
- •15. Timer/Counter Prescaler
- •15.0.1 Prescaler Reset
- •15.0.2 External Clock Source
- •15.1 Register Description
- •16.1 Features
- •16.2 Overview
- •16.3 Functional Descriptions
- •16.3.2 SPI Master Operation Example
- •16.3.3 SPI Slave Operation Example
- •16.3.5 Start Condition Detector
- •16.3.6 Clock speed considerations
- •16.4 Alternative USI Usage
- •16.4.4 Edge Triggered External Interrupt
- •16.4.5 Software Interrupt
- •16.5 Register Descriptions
- •17. Analog Comparator
- •17.1 Analog Comparator Multiplexed Input
- •17.2 Register Description
- •18. Analog to Digital Converter
- •18.1 Features
- •18.2 Overview
- •18.3 ADC Operation
- •18.4 Starting a Conversion
- •18.5 Prescaling and Conversion Timing
- •18.6 Changing Channel or Reference Selection
- •18.6.1 ADC Input Channels
- •18.6.2 ADC Voltage Reference
- •18.7 ADC Noise Canceler
- •18.7.1 Analog Input Circuitry
- •18.7.2 Analog Noise Canceling Techniques
- •18.7.3 ADC Accuracy Definitions
- •18.8 ADC Conversion Result
- •18.8.1 Single Ended Conversion
- •18.8.2 Unipolar Differential Conversion
- •18.8.3 Bipolar Differential Conversion
- •18.9 Temperature Measurement
- •18.10 Register Description
- •18.10.3.1 ADLAR = 0
- •18.10.3.2 ADLAR = 1
- •19. debugWIRE On-chip Debug System
- •19.1 Features
- •19.2 Overview
- •19.3 Physical Interface
- •19.4 Software Break Points
- •19.5 Limitations of debugWIRE
- •19.6 Register Description
- •20. Self-Programming the Flash
- •20.0.1 Performing Page Erase by SPM
- •20.0.2 Filling the Temporary Buffer (Page Loading)
- •20.0.3 Performing a Page Write
- •20.1.1 EEPROM Write Prevents Writing to SPMCSR
- •20.1.2 Reading the Fuse and Lock Bits from Software
- •20.1.3 Preventing Flash Corruption
- •20.1.4 Programming Time for Flash when Using SPM
- •20.2 Register Description
- •21. Memory Programming
- •21.1 Program And Data Memory Lock Bits
- •21.2 Fuse Bytes
- •21.2.1 Latching of Fuses
- •21.3 Signature Bytes
- •21.4 Calibration Byte
- •21.5 Page Size
- •21.6 Serial Downloading
- •21.6.1 Serial Programming Algorithm
- •21.6.2 Serial Programming Instruction set
- •21.7 High-voltage Serial Programming
- •21.8.2 Considerations for Efficient Programming
- •21.8.3 Chip Erase
- •21.8.4 Programming the Flash
- •21.8.5 Programming the EEPROM
- •21.8.6 Reading the Flash
- •21.8.7 Reading the EEPROM
- •21.8.8 Programming and Reading the Fuse and Lock Bits
- •21.8.9 Reading the Signature Bytes and Calibration Byte
- •22. Electrical Characteristics
- •22.1 Absolute Maximum Ratings*
- •22.2 Speed Grades
- •22.3 Clock Characterizations
- •22.3.1 Calibrated Internal RC Oscillator Accuracy
- •22.3.2 External Clock Drive Waveforms
- •22.3.3 External Clock Drive
- •22.4 System and Reset Characterizations
- •22.6 Serial Programming Characteristics
- •22.7 High-voltage Serial Programming Characteristics
- •23.1 Active Supply Current
- •23.2 Idle Supply Current
- •23.3 Supply Current of IO modules
- •23.3.0.1 Example 1
- •23.5 Standby Supply Current
- •23.7 Pin Driver Strength
- •23.8 Pin Threshold and Hysteresis
- •23.9 BOD Threshold and Analog Comparator Offset
- •23.10 Internal Oscillator Speed
- •23.11 Current Consumption of Peripheral Units
- •23.12 Current Consumption in Reset and Reset Pulsewidth
- •24. Register Summary
- •25. Instruction Set Summary
- •26. Ordering Information
- •26.1 ATtiny24
- •26.2 ATtiny44
- •26.3 ATtiny84
- •27. Packaging Information
- •28. Errata
- •28.1 ATtiny24
- •28.2 ATtiny44
- •28.3 ATtiny84
- •29. Datasheet Revision History
than the voltage of the negative pin or otherwise the voltage difference is saturated to zero. The result is presented in one-sided form, from 0x000 (0d) through 0x3FF (+1023d). The GAIN is either 1x or 20x.
18.8.3Bipolar Differential Conversion
If differential channels and a bipolar input mode are used, the result is
ADC (VPOS – VNEG) 512 GAIN
= ----------------------------------------------------
VREF
where VPOS is the voltage on the positive input pin, VNEG the voltage on the negative input pin, and VREF the selected voltage reference. The result is presented in two’s complement form, from 0x200 (-512d) through 0x1FF (+511d). The GAIN is either 1x or 20x. Note that if the user wants to perform a quick polarity check of the result, it is sufficient to read the MSB of the result (ADC9 in ADCH). If the bit is one, the result is negative, and if this bit is zero, the result is positive.
As default the ADC converter operates in the unipolar input mode, but the bipolar input mode can be selected by writting the BIN bit in the ADCSRB to one. In the bipolar input mode twosided voltage differences are allowed and thus the voltage on the negative input pin can also be larger than the voltage on the positive input pin.
18.9Temperature Measurement
The temperature measurement is based on an on-chip temperature sensor that is coupled to a single ended ADC8 channel. Selecting the ADC8 channel by writing the MUX5:0 bits in ADMUX register to “100010” enables the temperature sensor. The internal 1.1V reference must also be selected for the ADC reference source in the temperature sensor measurement. When the temperature sensor is enabled, the ADC converter can be used in single conversion mode to measure the voltage over the temperature sensor. The measured voltage has a linear relationship to the temperature as described in Table 51. The voltage sensitivity is approximately 1 mV / °C and the accuracy of the temperature measurement is +/- 10°C after offset calibration. Bandgap is always calibrated and its accuracy is only guaranteed between 1.0V and 1.2V
Table 18-2. Temperature vs. Sensor Output Voltage (Typical Case)
Temperature / °C |
-40 °C |
+25 °C |
+85 °C |
|
|
|
|
Voltage / mV |
243 mV |
314 mv |
380 mV |
|
|
|
|
The values described in Table 18-2 on page 150 are typical values. However, due to the process variation the temperature sensor output voltage varies from one chip to another. To be capable of achieving more accurate results the temperature measurement can be calibrated in the application software. The software calibration requires that a calibration value is measured and stored in a register or EEPROM for each chip, as a part of the production test. The sofware calibration can be done utilizing the formula:
T = {[(ADCH << 8) | ADCL] - TOS} / k
where ADCn are the ADC data registers, k is a fixed coefficient and TOS is the temperature sensor offset value determined and stored into EEPROM as a part of the production test.To obtain best accuracy the coefficient k should be measured using two temperature calibrations. Using offset calibration, set k = 1.0, where k = (1024*1.07mV/°C)/1.1V~1.0 [1/°C].
150 ATtiny24/44/84
8006E–AVR–09/06