- •Analysis and Application of Analog Electronic Circuits to Biomedical Instrumentation
- •Dedication
- •Preface
- •Reader Background
- •Rationale
- •Description of the Chapters
- •Features
- •The Author
- •Table of Contents
- •1.1 Introduction
- •1.2 Sources of Endogenous Bioelectric Signals
- •1.3 Nerve Action Potentials
- •1.4 Muscle Action Potentials
- •1.4.1 Introduction
- •1.4.2 The Origin of EMGs
- •1.5 The Electrocardiogram
- •1.5.1 Introduction
- •1.6 Other Biopotentials
- •1.6.1 Introduction
- •1.6.2 EEGs
- •1.6.3 Other Body Surface Potentials
- •1.7 Discussion
- •1.8 Electrical Properties of Bioelectrodes
- •1.9 Exogenous Bioelectric Signals
- •1.10 Chapter Summary
- •2.1 Introduction
- •2.2.1 Introduction
- •2.2.4 Schottky Diodes
- •2.3.1 Introduction
- •2.4.1 Introduction
- •2.5.1 Introduction
- •2.5.5 Broadbanding Strategies
- •2.6 Photons, Photodiodes, Photoconductors, LEDs, and Laser Diodes
- •2.6.1 Introduction
- •2.6.2 PIN Photodiodes
- •2.6.3 Avalanche Photodiodes
- •2.6.4 Signal Conditioning Circuits for Photodiodes
- •2.6.5 Photoconductors
- •2.6.6 LEDs
- •2.6.7 Laser Diodes
- •2.7 Chapter Summary
- •Home Problems
- •3.1 Introduction
- •3.2 DA Circuit Architecture
- •3.4 CM and DM Gain of Simple DA Stages at High Frequencies
- •3.4.1 Introduction
- •3.5 Input Resistance of Simple Transistor DAs
- •3.7 How Op Amps Can Be Used To Make DAs for Medical Applications
- •3.7.1 Introduction
- •3.8 Chapter Summary
- •Home Problems
- •4.1 Introduction
- •4.3 Some Effects of Negative Voltage Feedback
- •4.3.1 Reduction of Output Resistance
- •4.3.2 Reduction of Total Harmonic Distortion
- •4.3.4 Decrease in Gain Sensitivity
- •4.4 Effects of Negative Current Feedback
- •4.5 Positive Voltage Feedback
- •4.5.1 Introduction
- •4.6 Chapter Summary
- •Home Problems
- •5.1 Introduction
- •5.2.1 Introduction
- •5.2.2 Bode Plots
- •5.5.1 Introduction
- •5.5.3 The Wien Bridge Oscillator
- •5.6 Chapter Summary
- •Home Problems
- •6.1 Ideal Op Amps
- •6.1.1 Introduction
- •6.1.2 Properties of Ideal OP Amps
- •6.1.3 Some Examples of OP Amp Circuits Analyzed Using IOAs
- •6.2 Practical Op Amps
- •6.2.1 Introduction
- •6.2.2 Functional Categories of Real Op Amps
- •6.3.1 The GBWP of an Inverting Summer
- •6.4.3 Limitations of CFOAs
- •6.5 Voltage Comparators
- •6.5.1 Introduction
- •6.5.2. Applications of Voltage Comparators
- •6.5.3 Discussion
- •6.6 Some Applications of Op Amps in Biomedicine
- •6.6.1 Introduction
- •6.6.2 Analog Integrators and Differentiators
- •6.7 Chapter Summary
- •Home Problems
- •7.1 Introduction
- •7.2 Types of Analog Active Filters
- •7.2.1 Introduction
- •7.2.3 Biquad Active Filters
- •7.2.4 Generalized Impedance Converter AFs
- •7.3 Electronically Tunable AFs
- •7.3.1 Introduction
- •7.3.3 Use of Digitally Controlled Potentiometers To Tune a Sallen and Key LPF
- •7.5 Chapter Summary
- •7.5.1 Active Filters
- •7.5.2 Choice of AF Components
- •Home Problems
- •8.1 Introduction
- •8.2 Instrumentation Amps
- •8.3 Medical Isolation Amps
- •8.3.1 Introduction
- •8.3.3 A Prototype Magnetic IsoA
- •8.4.1 Introduction
- •8.6 Chapter Summary
- •9.1 Introduction
- •9.2 Descriptors of Random Noise in Biomedical Measurement Systems
- •9.2.1 Introduction
- •9.2.2 The Probability Density Function
- •9.2.3 The Power Density Spectrum
- •9.2.4 Sources of Random Noise in Signal Conditioning Systems
- •9.2.4.1 Noise from Resistors
- •9.2.4.3 Noise in JFETs
- •9.2.4.4 Noise in BJTs
- •9.3 Propagation of Noise through LTI Filters
- •9.4.2 Spot Noise Factor and Figure
- •9.5.1 Introduction
- •9.6.1 Introduction
- •9.7 Effect of Feedback on Noise
- •9.7.1 Introduction
- •9.8.1 Introduction
- •9.8.2 Calculation of the Minimum Resolvable AC Input Voltage to a Noisy Op Amp
- •9.8.5.1 Introduction
- •9.8.5.2 Bridge Sensitivity Calculations
- •9.8.7.1 Introduction
- •9.8.7.2 Analysis of SNR Improvement by Averaging
- •9.8.7.3 Discussion
- •9.10.1 Introduction
- •9.11 Chapter Summary
- •Home Problems
- •10.1 Introduction
- •10.2 Aliasing and the Sampling Theorem
- •10.2.1 Introduction
- •10.2.2 The Sampling Theorem
- •10.3 Digital-to-Analog Converters (DACs)
- •10.3.1 Introduction
- •10.3.2 DAC Designs
- •10.3.3 Static and Dynamic Characteristics of DACs
- •10.4 Hold Circuits
- •10.5 Analog-to-Digital Converters (ADCs)
- •10.5.1 Introduction
- •10.5.2 The Tracking (Servo) ADC
- •10.5.3 The Successive Approximation ADC
- •10.5.4 Integrating Converters
- •10.5.5 Flash Converters
- •10.6 Quantization Noise
- •10.7 Chapter Summary
- •Home Problems
- •11.1 Introduction
- •11.2 Modulation of a Sinusoidal Carrier Viewed in the Frequency Domain
- •11.3 Implementation of AM
- •11.3.1 Introduction
- •11.3.2 Some Amplitude Modulation Circuits
- •11.4 Generation of Phase and Frequency Modulation
- •11.4.1 Introduction
- •11.4.3 Integral Pulse Frequency Modulation as a Means of Frequency Modulation
- •11.5 Demodulation of Modulated Sinusoidal Carriers
- •11.5.1 Introduction
- •11.5.2 Detection of AM
- •11.5.3 Detection of FM Signals
- •11.5.4 Demodulation of DSBSCM Signals
- •11.6 Modulation and Demodulation of Digital Carriers
- •11.6.1 Introduction
- •11.6.2 Delta Modulation
- •11.7 Chapter Summary
- •Home Problems
- •12.1 Introduction
- •12.2.1 Introduction
- •12.2.2 The Analog Multiplier/LPF PSR
- •12.2.3 The Switched Op Amp PSR
- •12.2.4 The Chopper PSR
- •12.2.5 The Balanced Diode Bridge PSR
- •12.3 Phase Detectors
- •12.3.1 Introduction
- •12.3.2 The Analog Multiplier Phase Detector
- •12.3.3 Digital Phase Detectors
- •12.4 Voltage and Current-Controlled Oscillators
- •12.4.1 Introduction
- •12.4.2 An Analog VCO
- •12.4.3 Switched Integrating Capacitor VCOs
- •12.4.6 Summary
- •12.5 Phase-Locked Loops
- •12.5.1 Introduction
- •12.5.2 PLL Components
- •12.5.3 PLL Applications in Biomedicine
- •12.5.4 Discussion
- •12.6 True RMS Converters
- •12.6.1 Introduction
- •12.6.2 True RMS Circuits
- •12.7 IC Thermometers
- •12.7.1 Introduction
- •12.7.2 IC Temperature Transducers
- •12.8 Instrumentation Systems
- •12.8.1 Introduction
- •12.8.5 Respiratory Acoustic Impedance Measurement System
- •12.9 Chapter Summary
- •References
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Analysis and Application of Analog Electronic Circuits |
Note that other more sophisticated holds exist; their realization is at the expense of some circuit complexity, however. For example, the firstdifference extrapolator hold that generates linear slope transitions between sampling instants (instead of steps) can be realized with three DACs, a resettable analog integrator, and an analog adder (Northrop, 1990). Its transfer function can be shown to be:
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10.5 Analog-to-Digital Converters (ADCs)
10.5.1Introduction
Although the technology for DACs is relatively simple, there are many diverse kinds of ADCs and ADC algorithms. The five major categories of ADC are:
1.Tracking (servo) converters
2.Successive approximation converters
3.Integrating converters
4.Flash (parallel) converters
5.Oversampled (sigma–delta) converters
Next, each category will be examined and a description of how it works given.
Figure 10.9 shows the transfer characteristic of a 3-bit binary-output ADC. Note that an infinite-resolution analog signal, x(t), is quantized into eight 3- bit binary words, depending on its value. Figure 10.10 illustrates the normalized quantization error, (NQE) ∫ ve/LSB, of this converter; the quantization error voltage is given by:
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vc = vx − VFS bk 2−k = vx − VFS(b12−1 + b2 2−2 + b3 2−3 ), for N = 3. (10.33)
k =1
Note that the NQE is bounded by plus or minus one half LSB except for
vx/VFS ≥ 7/8, where it reaches +1 LSB at vx/VFS = 1. 1 LSB = VFS/23 = VFS/8 for this 3-bit ADC.
© 2004 by CRC Press LLC
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FIGURE 10.9
Transfer characteristic of an ideal 3-bit binary-output ADC.
10.5.2The Tracking (Servo) ADC
The first ADC considered is the tracking (servo) ADC, aka the counting ADC. A block diagram for this ADC is shown in Figure 10.11. When conversion is initiated, the up/down counter is reset and then counts up. The up/down counter’s digital output goes to a DAC. The DAC’s voltage output ramps up at a rate easily shown to be:
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© 2004 by CRC Press LLC
408 |
Analysis and Application of Analog Electronic Circuits |
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FIGURE 10.10
Normalized quantization error vs. input voltage for an ideal 3-bit binary ADC.
causing Vo to decrease by 1 LSB, thus bringing Vo < Vx; the comparator then goes HI and the next clock pulse increments the counter up, so Vo then exceeds Vx. The process repeats cyclically, generating a steady-state 1-LSB dither in the digital output.
When this ADC is used in the tracking mode to improve conversion speed, the LSB output is not used in order to avoid the steady-state dither. If the ADC is reset after each conversion, the end of conversion (EOC) signal occurs when Vo > Vx by 1 LSB the first time after conversion is initiated. Although this mode of operation avoids dither, it is slower and still has a conversion error between 0 and +1 LSB.
The servo counting ADC is well suited for data conversion of DC or low-frequency AC signals. It is also easy to implement in hardware (ICs). One disadvantage is that conversion time depends on the value of vx/Vxmax, i.e., it is variable. Another disadvantage is the LSB dither seen in the steady-state tracking mode.
10.5.3The Successive Approximation ADC
Like the servo counting ADC, the successive approximation ADC (SAADC) uses a comparator and a DAC in a closed-loop architecture, as shown in Figure 10.12. The conversion cycle for a 10-bit SAADC begins with a start signal from the controlling computer’s I/O interface at t = nT. Start causes the analog input signal, Vx, to be held at [Vx(nT)] and the counter’s
© 2004 by CRC Press LLC
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FIGURE 10.11
Top: block diagram of a tracking or servo ADC. Bottom: DAC output of the servo ADC showing numerical slew-rate limiting and dither.
output register is cleared (all bk 0 except for b1 = 0 (MSB)). This action causes the DAC output, Vo, to go to 512VR/1024 = VR/2. The comparator subtracts this Vo from [Vx(nT)] and performs the operation,
Q = sgn([Vx (nT)]− VR 2) |
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If Q = 1, then b1 is kept 1 (HI); if Q = −1, then b1 is set to 0 (LO). Next, b2 is set to 1 (b1 retains the value determined in the first cycle). Now the DAC output is Vo = VR (b1/2 + 1/22). The comparator tests to see if sgn{[Vx ((n + 1)T] − Vo} = 1. If yes, b2 stays at 1, if no, b2 0, completing the second bit’s conversion cycle. Now b3 1 and Vo = VR (b1/2 + b2/4 + 1/23) and the process continues. Q = sgn{Vx ((n + 2)T] − Vo} is tested, etc. until all 10 bits have been tested. Figure 10.13, adapted from Northrop (1990), illustrates a logical flowchart for the operation of a 10-bit SAADC; note b1 = MSB and b10 = LSB.
© 2004 by CRC Press LLC