- •Preface
- •Contents
- •1.1 Fundamentals of the semiclassical laser theory
- •1.1.1 The laser oscillator
- •1.1.2.2 Homogeneous, isotropic, linear dielectrics
- •1.1.2.2.1 The plane wave
- •1.1.2.2.2 The spherical wave
- •1.1.2.2.3 The slowly varying envelope (SVE) approximation
- •1.1.2.3 Propagation in doped media
- •1.1.3 Interaction with two-level systems
- •1.1.3.1 The two-level system
- •1.1.3.2 The dipole approximation
- •1.1.3.2.1 Inversion density and polarization
- •1.1.3.3.1 Decay time T1 of the upper level (energy relaxation)
- •1.1.3.3.1.1 Spontaneous emission
- •1.1.3.3.1.2 Interaction with the host material
- •1.1.3.3.1.3 Pumping process
- •1.1.3.3.2 Decay time T2 of the polarization (entropy relaxation)
- •1.1.4 Steady-state solutions
- •1.1.4.1 Inversion density and polarization
- •1.1.4.2 Small-signal solutions
- •1.1.4.3 Strong-signal solutions
- •1.1.5 Adiabatic equations
- •1.1.5.1 Rate equations
- •1.1.5.2 Thermodynamic considerations
- •1.1.5.3 Pumping schemes and complete rate equations
- •1.1.5.3.1 The three-level system
- •1.1.5.3.2 The four-level system
- •1.1.5.5 Rate equations for steady-state laser oscillators
- •1.1.6 Line shape and line broadening
- •1.1.6.1 Normalized shape functions
- •1.1.6.1.1 Lorentzian line shape
- •1.1.6.1.2 Gaussian line shape
- •1.1.6.1.3 Normalization of line shapes
- •1.1.6.2 Mechanisms of line broadening
- •1.1.6.2.1 Spontaneous emission
- •1.1.6.2.2 Doppler broadening
- •1.1.6.2.3 Collision or pressure broadening
- •1.1.6.2.4 Saturation broadening
- •1.1.6.3 Types of broadening
- •1.1.6.3.1 Homogeneous broadening
- •1.1.6.3.2 Inhomogeneous broadening
- •1.1.6.4 Time constants
- •1.1.7 Coherent interaction
- •1.1.7.1 The Feynman representation of interaction
- •1.1.7.3 Propagation of resonant coherent pulses
- •1.1.7.3.2 Superradiance
- •1.1.8 Notations
- •References for 1.1
- •2.1.1 Introduction
- •2.1.3 Radiometric standards
- •2.1.3.1 Primary standards
- •2.1.3.2 Secondary standards
- •References for 2.1
- •2.2 Beam characterization
- •2.2.1 Introduction
- •2.2.2 The Wigner distribution
- •2.2.3 The second-order moments of the Wigner distribution
- •2.2.4 The second-order moments and related physical properties
- •2.2.4.3 Phase paraboloid and twist
- •2.2.4.4 Invariants
- •2.2.4.5 Propagation of beam widths and beam propagation ratios
- •2.2.5.1 Stigmatic beams
- •2.2.5.2 Simple astigmatic beams
- •2.2.5.3 General astigmatic beams
- •2.2.5.4 Pseudo-symmetric beams
- •2.2.5.5 Intrinsic astigmatism and beam conversion
- •2.2.6 Measurement procedures
- •2.2.7 Beam positional stability
- •References for 2.2
- •3 Linear optics
- •3.1 Linear optics
- •3.1.1 Wave equations
- •3.1.2 Polarization
- •3.1.3 Solutions of the wave equation in free space
- •3.1.3.1 Wave equation
- •3.1.3.1.1 Monochromatic plane wave
- •3.1.3.1.2 Cylindrical vector wave
- •3.1.3.1.3 Spherical vector wave
- •3.1.3.2 Helmholtz equation
- •3.1.3.2.1 Plane wave
- •3.1.3.2.2 Cylindrical wave
- •3.1.3.2.3 Spherical wave
- •3.1.3.2.4.2 Real Bessel beams
- •3.1.3.2.4.3 Vectorial Bessel beams
- •3.1.3.3 Solutions of the slowly varying envelope equation
- •3.1.3.3.1 Gauss-Hermite beams (rectangular symmetry)
- •3.1.3.3.2 Gauss-Laguerre beams (circular symmetry)
- •3.1.3.3.3 Cross-sectional shapes of the Gaussian modes
- •3.1.4.4.2 Circular aperture with radius a
- •3.1.4.4.2.1 Applications
- •3.1.4.4.3 Gratings
- •3.1.5 Optical materials
- •3.1.5.1 Dielectric media
- •3.1.5.2 Optical glasses
- •3.1.5.3 Dispersion characteristics for short-pulse propagation
- •3.1.5.4 Optics of metals and semiconductors
- •3.1.5.6 Special cases of refraction
- •3.1.5.6.2 Variation of the angle of incidence
- •3.1.5.7 Crystal optics
- •3.1.5.7.2 Birefringence (example: uniaxial crystals)
- •3.1.5.8 Photonic crystals
- •3.1.5.9 Negative-refractive-index materials
- •3.1.5.10 References to data of linear optics
- •3.1.6 Geometrical optics
- •3.1.6.1 Gaussian imaging (paraxial range)
- •3.1.6.1.1 Single spherical interface
- •3.1.6.1.2 Imaging with a thick lens
- •3.1.6.2.1 Simple interfaces and optical elements with rotational symmetry
- •3.1.6.2.2 Non-symmetrical optical systems
- •3.1.6.2.3 Properties of a system
- •3.1.6.2.4 General parabolic systems without rotational symmetry
- •3.1.6.2.5 General astigmatic system
- •3.1.6.2.6 Symplectic optical system
- •3.1.6.2.7 Misalignments
- •3.1.6.3 Lens aberrations
- •3.1.7 Beam propagation in optical systems
- •3.1.7.2.1 Stigmatic and simple astigmatic beams
- •3.1.7.2.1.1 Fundamental Mode
- •3.1.7.2.1.2 Higher-order Hermite-Gaussian beams in simple astigmatic beams
- •3.1.7.2.2 General astigmatic beam
- •3.1.7.3 Waist transformation
- •3.1.7.3.1 General system (fundamental mode)
- •3.1.7.3.2 Thin lens (fundamental mode)
- •3.1.7.4 Collins integral
- •3.1.7.4.1 Two-dimensional propagation
- •3.1.7.4.2 Three-dimensional propagation
- •3.1.7.5 Gaussian beams in optical systems with stops, aberrations, and waveguide coupling
- •3.1.7.5.1 Field distributions in the waist region of Gaussian beams including stops and wave aberrations by optical system
- •3.1.7.5.2 Mode matching for beam coupling into waveguides
- •3.1.7.5.3 Free-space coupling of Gaussian modes
- •References for 3.1
- •4.1 Frequency conversion in crystals
- •4.1.1 Introduction
- •4.1.1.1 Symbols and abbreviations
- •4.1.1.1.1 Symbols
- •4.1.1.1.2 Abbreviations
- •4.1.1.1.3 Crystals
- •4.1.1.2 Historical layout
- •4.1.2 Fundamentals
- •4.1.2.1 Three-wave interactions
- •4.1.2.2 Uniaxial crystals
- •4.1.2.3 Biaxial crystals
- •4.1.2.5.1 General approach
- •4.1.3 Selection of data
- •4.1.5 Sum frequency generation
- •4.1.7 Optical parametric oscillation
- •4.1.8 Picosecond continuum generation
- •References for 4.1
- •4.2 Frequency conversion in gases and liquids
- •4.2.1 Fundamentals of nonlinear optics in gases and liquids
- •4.2.1.1 Linear and nonlinear susceptibilities
- •4.2.1.2 Third-order nonlinear susceptibilities
- •4.2.1.3 Fundamental equations of nonlinear optics
- •4.2.1.4 Small-signal limit
- •4.2.1.5 Phase-matching condition
- •4.2.2 Frequency conversion in gases
- •4.2.2.1 Metal-vapor inert gas mixtures
- •4.2.2.3 Mixtures of gaseous media
- •References for 4.2
- •4.3 Stimulated scattering
- •4.3.1 Introduction
- •4.3.1.1 Spontaneous scattering processes
- •4.3.1.2 Relationship between stimulated Stokes scattering and spontaneous scattering
- •4.3.2 General properties of stimulated scattering
- •4.3.2.1 Exponential gain by stimulated Stokes scattering
- •4.3.2.2 Experimental observation
- •4.3.2.2.1 Generator setup
- •4.3.2.2.2 Oscillator setup
- •4.3.2.3 Four-wave interactions
- •4.3.2.3.1 Third-order nonlinear susceptibility
- •4.3.2.3.3 Higher-order Stokes and anti-Stokes emission
- •4.3.2.4 Transient stimulated scattering
- •4.3.3 Individual scattering processes
- •4.3.3.1 Stimulated Raman scattering (SRS)
- •4.3.3.2 Stimulated Brillouin scattering (SBS) and stimulated thermal Brillouin scattering (STBS)
- •4.3.3.3 Stimulated Rayleigh scattering processes, SRLS, STRS, and SRWS
- •References for 4.3
- •4.4 Phase conjugation
- •4.4.1 Introduction
- •4.4.2 Basic mathematical description
- •4.4.3 Phase conjugation by degenerate four-wave mixing
- •4.4.4 Self-pumped phase conjugation
- •4.4.5 Applications of SBS phase conjugation
- •4.4.6 Photorefraction
- •References for 4.4
Ref. p. 70] |
2.2 Beam characterization |
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At least one cylindrical lens is needed for the measurement of the missing di erence of the crossed mixed moments xv c,0 − yu c,0 . To retrieve it, a cylindrical lens with focal length f is inserted into the beam path at an arbitrary position in the beam waist region. Firstly, this cylindrical lens shall be aligned with the x-axis and the spatial moment xy 1 is measured in the focal distance behind the lens (Fig. 2.2.8, middle). Next, the lens is rotated by 90 degrees and the spatial moment xy 2 is again measured in the focal distance from the lens (Fig. 2.2.8, right). The missing di erence of the crossed mixed moments of the reference plane is then given by
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2.2.7 Beam positional stability
2.2.7.1 Absolute fluctuations
For various reasons a laser beam may fluctuate in position and/or direction. The positional fluctuations in a transverse plane may be measured by the variance of the first-order spatial moments of the beam profile:
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where x i and y i are the first-order moments determined in N individual measurements and
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fluctuations are di erent from plane to plane. It can be shown that, under some reasonable assumptions, the positional fluctuations can be characterized closely analogous to the characterization of the beam extent based on the second-order moments of the Wigner distribution [94Mor, 96Mor]. Within this concept, the fluctuation properties of a laser beam are completely determined by ten di erent parameters, arranged in a symmetric 4 × 4 matrix
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obeying the same simple propagation law as the centered second-order moments:
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The elements of the beam fluctuation matrix may be considered as the centered second-order moments of a probability distribution p (x, y, u, v) giving the probability that the fluctuation beam
Landolt-B¨ornstein
New Series VIII/1A1
68 |
2.2.7 Beam positional stability |
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has a position (x, y) and direction (u, v) at a random measurement. Similar to the second-order moments of the Wigner distribution, only the three spatial moments are directly measurable. The complete set can be obtained from a z-scan measurement as described in the section above, by acquiring a couple of power density distributions in any measurement plane, calculating the firstorder spatial moments from each profile, derive the three variances according to (2.2.79)–(2.2.81), and obtaining the second-order fluctuation moments in the reference plane from a fitting process. Again, measurements behind a cylindrical lens are necessary to achieve all ten parameters.
Fluctuation widths can be derived from the second-order fluctuation moments. In analogy to the beam width definitions, the fluctuation widths are
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where ∆x and ∆y are the beam fluctuation widths along the principal axes of the beam positional fluctuations and where
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is the signed angle between the x-axis and that principal axis of the beam fluctuation which is closer to the x-axis (Fig. 2.2.9). The principal axes of the beam positional fluctuations may not coincide with the principal axes of the power density distribution.
The width of the positional fluctuations along an arbitrary direction, given by the azimuthal angle α, is given by
∆α = 4 x2 s cos2 α + 2 xy s sin α cos α + y2 s sin2 α . (2.2.88)
Landolt-B¨ornstein
New Series VIII/1A1
Ref. p. 70] |
2.2 Beam characterization |
69 |
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2.2.7.2 Relative fluctuations
For many applications the widths of the positional fluctuations compared to the momentary beam profile width might be more relevant than the absolute fluctuation widths. The relative fluctuation along an arbitrary direction, given by the azimuthal angle α, is defined by
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2.2.7.3 E ective long-term beam widths
For applications with response times much longer than the typical fluctuation durations the timeaveraged intensity distribution rather than the momentary beam profile determines the process results:
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The e ective width of the time-averaged power density profile along an azimuthal direction enclosing an angle of α with the x-axis can be obtained from the widths of the momentary beam profile and the fluctuation width by
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(2.2.92) |
Landolt-B¨ornstein
New Series VIII/1A1