- •Features
- •Disclaimer
- •Overview
- •Block Diagram
- •Pin Descriptions
- •Port A (PA7..PA0)
- •Port B (PB7..PB0)
- •Port C (PC7..PC0)
- •Port D (PD7..PD0)
- •RESET
- •XTAL1
- •XTAL2
- •AVCC
- •AREF
- •Resources
- •Data Retention
- •AVR CPU Core
- •Introduction
- •Status Register
- •Stack Pointer
- •I/O Memory
- •Clock Systems and their Distribution
- •Clock Sources
- •Crystal Oscillator
- •External Clock
- •Idle Mode
- •Power-down Mode
- •Power-save Mode
- •Standby Mode
- •Analog Comparator
- •Brown-out Detector
- •Watchdog Timer
- •Port Pins
- •Resetting the AVR
- •Reset Sources
- •Power-on Reset
- •External Reset
- •Watchdog Reset
- •Watchdog Timer
- •Interrupts
- •I/O Ports
- •Introduction
- •Configuring the Pin
- •Reading the Pin Value
- •Unconnected pins
- •Alternate Port Functions
- •Register Description for I/O Ports
- •8-bit Timer/Counter0 with PWM
- •Overview
- •Registers
- •Definitions
- •Counter Unit
- •Normal Mode
- •Fast PWM Mode
- •8-bit Timer/Counter Register Description
- •Timer/Counter0 and Timer/Counter1 Prescalers
- •Internal Clock Source
- •Prescaler Reset
- •External Clock Source
- •16-bit Timer/Counter1
- •Overview
- •Registers
- •Definitions
- •Compatibility
- •Counter Unit
- •Input Capture Unit
- •Noise Canceler
- •Force Output Compare
- •Normal Mode
- •Fast PWM Mode
- •16-bit Timer/Counter Register Description
- •8-bit Timer/Counter2 with PWM and Asynchronous Operation
- •Overview
- •Registers
- •Definitions
- •Counter Unit
- •Normal Mode
- •Fast PWM Mode
- •8-bit Timer/Counter Register Description
- •Slave Mode
- •Master Mode
- •Data Modes
- •USART
- •Overview
- •Clock Generation
- •External Clock
- •Frame Formats
- •Parity Bit Calculation
- •Parity Generator
- •Receiver Error Flags
- •Parity Checker
- •Disabling the Receiver
- •Using MPCM
- •Write Access
- •Read Access
- •Features
- •TWI Terminology
- •Transferring Bits
- •Address Packet Format
- •Data Packet Format
- •Overview of the TWI Module
- •SCL and SDA Pins
- •Bus Interface Unit
- •Address Match Unit
- •Control Unit
- •Using the TWI
- •Master Receiver Mode
- •Slave Receiver Mode
- •Miscellaneous States
- •Analog Comparator Multiplexed Input
- •Analog to Digital Converter
- •Features
- •Operation
- •Changing Channel or Reference Selection
- •ADC Input Channels
- •Analog Input Circuitry
- •Features
- •Overview
- •TAP Controller
- •PRIVATE0; $8
- •PRIVATE1; $9
- •PRIVATE2; $A
- •PRIVATE3; $B
- •Bibliography
- •IEEE 1149.1 (JTAG) Boundary-scan
- •Features
- •System Overview
- •Data Registers
- •Bypass Register
- •Reset Register
- •EXTEST; $0
- •IDCODE; $1
- •AVR_RESET; $C
- •BYPASS; $F
- •Scanning the ADC
- •ATmega16 Boundary-scan Order
- •Features
- •Application Section
- •Read-While-Write and no Read- While-Write Flash Sections
- •Prevent Reading the RWW Section during Self-Programming
- •Simple Assembly Code Example for a Boot Loader
- •Fuse Bits
- •Latching of Fuses
- •Signature Bytes
- •Calibration Byte
- •Page Size
- •Signal Names
- •Chip Erase
- •Reading the Flash
- •Reading the EEPROM
- •Data Polling Flash
- •Data Polling EEPROM
- •AVR_RESET ($C)
- •PROG_ENABLE ($4)
- •Data Registers
- •Reset Register
- •Programming Enable Register
- •Programming Command Register
- •Virtual Flash Page Read Register
- •Performing Chip Erase
- •Reading the Flash
- •Reading the EEPROM
- •Electrical Characteristics
- •Absolute Maximum Ratings*
- •DC Characteristics
- •External Clock Drive Waveforms
- •External Clock Drive
- •Two-wire Serial Interface Characteristics
- •ADC Characteristics
- •Idle Supply Current
- •Pin Pullup
- •Pin Driver Strength
- •Register Summary
- •Instruction Set Summary
- •Ordering Information
- •Packaging Information
- •Errata
On-chip Debug
Specific JTAG
Instructions
PRIVATE0; $8
A debugger, like the AVR Studio, may however use one or more of these resources for its internal purpose, leaving less flexibility to the end-user.
A list of the On-chip Debug specific JTAG instructions is given in “On-chip Debug Specific JTAG Instructions” on page 226.
The JTAGEN Fuse must be programmed to enable the JTAG Test Access Port. In addition, the OCDEN Fuse must be programmed and no Lock bits must be set for the On-chip Debug system to work. As a security feature, the On-chip Debug system is disabled when any Lock bits are set. Otherwise, the On-chip Debug system would have provided a back-door into a secured device.
The AVR JTAG ICE from Atmel is a powerful development tool for On-chip Debugging of all AVR 8-bit RISC Microcontrollers with IEEE 1149.1 compliant JTAG interface. The JTAG ICE and the AVR Studio user interface give the user complete control of the internal resources of the microcontroller, helping to reduce development time by making debugging easier. The JTAG ICE performs real-time emulation of the microcontroller while it is running in a target system.
Please refer to the Support Tools section on the AVR pages on www.atmel.com for a full description of the AVR JTEG ICE. AVR Studio can be downloaded free from Software section on the same web site.
All necessary execution commands are available in AVR Studio, both on source level and on disassembly level. The user can execute the program, single step through the code either by tracing into or stepping over functions, step out of functions, place the cursor on a statement and execute until the statement is reached, stop the execution, and reset the execution target. In addition, the user can have an unlimited number of code breakpoints (using the BREAK instruction) and up to two data memory breakpoints, alternatively combined as a mask (range) Break Point.
The On-chip Debug support is considered being private JTAG instructions, and distributed within ATMEL and to selected third party vendors only. Instruction opcodes are listed for reference.
Private JTAG instruction for accessing On-chip Debug system.
PRIVATE1; $9 |
Private JTAG instruction for accessing On-chip Debug system. |
PRIVATE2; $A |
Private JTAG instruction for accessing On-chip Debug system. |
PRIVATE3; $B |
Private JTAG instruction for accessing On-chip Debug system. |
226 ATmega16(L)
2466P–AVR–08/07
ATmega16(L)
On-chip Debug
Related Register in
I/O Memory
On-chip Debug
Register – OCDR
Bit |
7 |
6 |
5 |
4 |
3 |
2 |
1 |
0 |
|
|
MSB/IDRD |
|
|
|
|
|
|
LSB |
OCDR |
|
|
|
|
|
|
|
|
|
|
Read/Write |
R/W |
R/W |
R/W |
R/W |
R/W |
R/W |
R/W |
R/W |
|
Initial Value |
0 |
0 |
0 |
0 |
0 |
0 |
0 |
0 |
|
Using the JTAG
Programming
Capabilities
The OCDR Register provides a communication channel from the running program in the microcontroller to the debugger. The CPU can transfer a byte to the debugger by writing to this location. At the same time, an Internal Flag; I/O Debug Register Dirty – IDRD – is set to indicate to the debugger that the register has been written. When the CPU reads the OCDR Register the 7 LSB will be from the OCDR Register, while the MSB is the IDRD bit. The debugger clears the IDRD bit when it has read the information.
In some AVR devices, this register is shared with a standard I/O location. In this case, the OCDR Register can only be accessed if the OCDEN Fuse is programmed, and the debugger enables access to the OCDR Register. In all other cases, the standard I/O location is accessed.
Refer to the debugger documentation for further information on how to use this register.
Programming of AVR parts via JTAG is performed via the 4-pin JTAG port, TCK, TMS, TDI and TDO. These are the only pins that need to be controlled/observed to perform JTAG programming (in addition to power pins). It is not required to apply 12V externally. The JTAGEN Fuse must be programmed and the JTD bit in the MCUSR Register must be cleared to enable the JTAG Test Access Port.
The JTAG programming capability supports:
•Flash programming and verifying
•EEPROM programming and verifying
•Fuse programming and verifying
•Lock bit programming and verifying
|
The Lock bit security is exactly as in Parallel Programming mode. If the Lock bits LB1 or LB2 are |
|
programmed, the OCDEN Fuse cannot be programmed unless first doing a chip erase. This is a |
|
security feature that ensures no back-door exists for reading out the content of a secured |
|
device. |
|
The details on programming through the JTAG interface and programming specific JTAG |
|
instructions are given in the section “Programming via the JTAG Interface” on page 278. |
Bibliography |
For more information about general Boundary-scan, the following literature can be consulted: |
|
• IEEE: IEEE Std. 1149.1-1990. IEEE Standard Test Access Port and Boundary-scan |
|
Architecture, IEEE, 1993 |
|
• Colin Maunder: The Board Designers Guide to Testable Logic Circuits, Addison-Wesley, |
|
1992 |
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