- •Features
- •1. Pin Configurations
- •1.1 Disclaimer
- •2. Overview
- •2.1 Block Diagram
- •2.2 Pin Descriptions
- •2.2.3 Port B (PB5..PB0)
- •2.2.4 RESET
- •3. About Code Examples
- •4. AVR CPU Core
- •4.1 Introduction
- •4.2 Architectural Overview
- •4.4 Status Register
- •4.5 General Purpose Register File
- •4.6 Stack Pointer
- •4.7 Instruction Execution Timing
- •4.8 Reset and Interrupt Handling
- •4.8.1 Interrupt Response Time
- •5. AVR ATtiny25/45/85 Memories
- •5.2 SRAM Data Memory
- •5.2.1 Data Memory Access Times
- •5.3 EEPROM Data Memory
- •5.3.1 EEPROM Read/Write Access
- •5.3.5 Atomic Byte Programming
- •5.3.6 Split Byte Programming
- •5.3.7 Erase
- •5.3.8 Write
- •5.3.9 Preventing EEPROM Corruption
- •5.4 I/O Memory
- •6. System Clock and Clock Options
- •6.1 Clock Systems and their Distribution
- •6.2 Clock Sources
- •6.3 Default Clock Source
- •6.4 Crystal Oscillator
- •6.6 Calibrated Internal RC Oscillator
- •6.7 External Clock
- •6.8 128 kHz Internal Oscillator
- •6.9 Clock Output Buffer
- •6.10 System Clock Prescaler
- •6.10.2 Switching Time
- •7. Power Management and Sleep Modes
- •7.1 Idle Mode
- •7.2 ADC Noise Reduction Mode
- •7.4 Power Reduction Register
- •7.5 Minimizing Power Consumption
- •7.5.1 Analog to Digital Converter
- •7.5.2 Analog Comparator
- •7.5.4 Internal Voltage Reference
- •7.5.5 Watchdog Timer
- •7.5.6 Port Pins
- •8. System Control and Reset
- •8.0.1 Resetting the AVR
- •8.0.2 Reset Sources
- •8.0.3 Power-on Reset
- •8.0.4 External Reset
- •8.0.6 Watchdog Reset
- •8.1 Internal Voltage Reference
- •8.2 Watchdog Timer
- •8.3 Timed Sequences for Changing the Configuration of the Watchdog Timer
- •8.3.1 Safety Level 1
- •8.3.2 Safety Level 2
- •9. Interrupts
- •9.1 Interrupt Vectors in ATtiny25/45/85
- •10. External Interrupts
- •11. I/O Ports
- •11.1 Introduction
- •11.2 Ports as General Digital I/O
- •11.2.1 Configuring the Pin
- •11.2.2 Toggling the Pin
- •11.2.3 Switching Between Input and Output
- •11.2.4 Reading the Pin Value
- •11.2.5 Digital Input Enable and Sleep Modes
- •11.2.6 Unconnected Pins
- •11.3 Alternate Port Functions
- •11.3.2 Alternate Functions of Port B
- •12. 8-bit Timer/Counter0 with PWM
- •12.1 Overview
- •12.1.1 Registers
- •12.1.2 Definitions
- •12.2 Timer/Counter Clock Sources
- •12.3 Counter Unit
- •12.4 Output Compare Unit
- •12.4.1 Force Output Compare
- •12.4.2 Compare Match Blocking by TCNT0 Write
- •12.4.3 Using the Output Compare Unit
- •12.5 Compare Match Output Unit
- •12.5.1 Compare Output Mode and Waveform Generation
- •12.6 Modes of Operation
- •12.6.1 Normal Mode
- •12.6.2 Clear Timer on Compare Match (CTC) Mode
- •12.6.3 Fast PWM Mode
- •12.6.4 Phase Correct PWM Mode
- •12.7 Timer/Counter Timing Diagrams
- •13. Timer/Counter Prescaler
- •13.0.1 Prescaler Reset
- •13.0.2 External Clock Source
- •14. 8-bit Timer/Counter1
- •14.1 Timer/Counter1
- •14.1.1 Timer/Counter1 Control Register - TCCR1
- •14.1.2 General Timer/Counter1 Control Register - GTCCR
- •14.1.3 Timer/Counter1 - TCNT1
- •14.1.4 Timer/Counter1 Output Compare RegisterA - OCR1A
- •14.1.5 Timer/Counter1 Output Compare RegisterB - OCR1B
- •14.1.6 Timer/Counter1 Output Compare RegisterC - OCR1C
- •14.1.7 Timer/Counter Interrupt Mask Register - TIMSK
- •14.1.8 Timer/Counter Interrupt Flag Register - TIFR
- •14.1.9 PLL Control and Status Register - PLLCSR
- •14.1.10 Timer/Counter1 Initialization for Asynchronous Mode
- •14.1.11 Timer/Counter1 in PWM Mode
- •15. 8-bit Timer/Counter1 in ATtiny15 Mode
- •15.1 Timer/Counter1 Prescaler
- •15.2 Timer/Counter1
- •15.2.1 Timer/Counter1 Control Register - TCCR1
- •15.2.2 General Timer/Counter1 Control Register - GTCCR
- •15.2.3 Timer/Counter1 - TCNT1
- •15.2.4 Timer/Counter1 Output Compare RegisterA - OCR1A
- •15.2.5 Timer/Counter1 Output Compare Register C - OCR1C
- •15.2.6 Timer/Counter1 Interrupt Mask Register - TIMSK
- •15.2.7 Timer/Counter Interrupt Flag Register - TIFR
- •15.2.8 PLL Control and Status Register - PLLCSR
- •15.2.9 Timer/Counter1 in PWM Mode
- •16. Dead Time Generator
- •16.0.1 Timer/Counter1 Dead Time Prescaler register 1 - DTPS1
- •16.0.2 Timer/Counter1 Dead Time A - DT1A
- •16.0.3 Timer/Counter1 Dead Time B - DT1B
- •17.1 Overview
- •17.2 Functional Descriptions
- •17.2.2 SPI Master Operation Example
- •17.2.3 SPI Slave Operation Example
- •17.2.5 Start Condition Detector
- •17.3 Alternative USI Usage
- •17.3.4 Edge Triggered External Interrupt
- •17.3.5 Software Interrupt
- •17.4 USI Register Descriptions
- •18. Analog Comparator
- •18.1 Analog Comparator Multiplexed Input
- •19. Analog to Digital Converter
- •19.1 Features
- •19.2 Operation
- •19.3 Starting a Conversion
- •19.4 Prescaling and Conversion Timing
- •19.5 Changing Channel or Reference Selection
- •19.5.1 ADC Input Channels
- •19.5.2 ADC Voltage Reference
- •19.6 ADC Noise Canceler
- •19.6.1 Analog Input Circuitry
- •19.6.2 Analog Noise Canceling Techniques
- •19.6.3 ADC Accuracy Definitions
- •19.7 ADC Conversion Result
- •19.7.1 Single Ended Conversion
- •19.7.2 Unipolar Differential Conversion
- •19.7.3 Bipolar Differential Conversion
- •19.7.4 Temperature Measurement (Preliminary description)
- •19.7.7.1 ADLAR = 0
- •19.7.7.2 ADLAR = 1
- •20. debugWIRE On-chip Debug System
- •20.1 Features
- •20.2 Overview
- •20.3 Physical Interface
- •20.4 Software Break Points
- •20.5 Limitations of debugWIRE
- •20.6 debugWIRE Related Register in I/O Memory
- •21. Self-Programming the Flash
- •21.0.1 Performing Page Erase by SPM
- •21.0.2 Filling the Temporary Buffer (Page Loading)
- •21.0.3 Performing a Page Write
- •21.1.2 EEPROM Write Prevents Writing to SPMCSR
- •21.1.3 Reading the Fuse and Lock Bits from Software
- •21.1.4 Preventing Flash Corruption
- •21.1.5 Programming Time for Flash when Using SPM
- •22. Memory Programming
- •22.1 Program And Data Memory Lock Bits
- •22.2 Fuse Bytes
- •22.2.1 Latching of Fuses
- •22.3 Signature Bytes
- •22.3.1 ATtiny25 Signature Bytes
- •22.3.2 ATtiny45 Signature Bytes
- •22.3.3 ATtiny85 Signature Bytes
- •22.4 Calibration Byte
- •22.5 Page Size
- •22.6 Serial Downloading
- •22.6.1 Serial Programming Algorithm
- •22.6.2 Serial Programming Characteristics
- •22.7 High-voltage Serial Programming
- •22.8.2 Considerations for Efficient Programming
- •22.8.3 Chip Erase
- •22.8.4 Programming the Flash
- •22.8.5 Programming the EEPROM
- •22.8.6 Reading the Flash
- •22.8.7 Reading the EEPROM
- •22.8.8 Programming and Reading the Fuse and Lock Bits
- •22.8.9 Reading the Signature Bytes and Calibration Byte
- •23. Electrical Characteristics
- •23.1 Absolute Maximum Ratings*
- •23.2 External Clock Drive Waveforms
- •23.3 External Clock Drive
- •25. Register Summary
- •26. Instruction Set Summary
- •27. Ordering Information
- •27.1 ATtiny25
- •27.2 ATtiny45
- •27.3 ATtiny85
- •28. Packaging Information
- •29. Errata
- •29.1 ATtiny25/45/85 Rev. A
- •30. Datasheet Revision History
- •Table of Contents
The next code examples show assembly and C functions for reading the EEPROM. The examples assume that interrupts are controlled so that no interrupts will occur during execution of these functions.
Assembly Code Example
EEPROM_read:
; Wait for completion of previous write sbic EECR,EEPE
rjmp EEPROM_read
; Set up address (r17) in address register out EEARL, r17
; Start eeprom read by writing EERE sbi EECR,EERE
; Read data from data register in r16,EEDR
ret
C Code Example
unsigned char EEPROM_read(unsigned char ucAddress)
{
/* Wait for completion of previous write */ while(EECR & (1<<EEPE))
;
/* Set up address register */ EEARL = ucAddress;
/* Start eeprom read by writing EERE */
EECR |= (1<<EERE);
/* Return data from data register */ return EEDR;
}
5.3.9Preventing EEPROM Corruption
During periods of low VCC, the EEPROM data can be corrupted because the supply voltage is too low for the CPU and the EEPROM to operate properly. These issues are the same as for board level systems using EEPROM, and the same design solutions should be applied.
An EEPROM data corruption can be caused by two situations when the voltage is too low. First, a regular write sequence to the EEPROM requires a minimum voltage to operate correctly. Secondly, the CPU itself can execute instructions incorrectly, if the supply voltage is too low.
EEPROM data corruption can easily be avoided by following this design recommendation:
Keep the AVR RESET active (low) during periods of insufficient power supply voltage. This can be done by enabling the internal Brown-out Detector (BOD). If the detection level of the internal BOD does not match the needed detection level, an external low VCC reset protection circuit can be used. If a reset occurs while a write operation is in progress, the write operation will be completed provided that the power supply voltage is sufficient.
20 ATtiny25/45/85
2586A–AVR–02/05